ID |
Date |
Author |
Project |
Measurement Type |
Object ID |
Subject |
Text |
|
37
|
Tue May 19 09:31:50 2015 |
Hao Yin | | | | Noise Test ITA | Everything works except L3 p-side.
The config file is shown in the
following: |
|
38
|
Tue May 19 10:08:53 2015 |
Hao Yin | | | | FADC system setup success | 3 FADC. All Channel/APV25 running (except
L3 n first and last -> not connected (bonding))
n-side: all connectors |
|
42
|
Tue May 19 13:42:04 2015 |
Hao Yin | | | | L6 Noise inJection Setup | Test Nr. 1:
RLC between DockBox and Hybrid
(both side). |
|
44
|
Wed May 20 10:12:12 2015 |
Hao Yin | | | | Ladder RLC test (CMC Injection) | L5 Ladder Test
folder: /mnt/data/ITA_NOISE_TESTS/Ladder_test
Setup: ladder |
|
45
|
Thu May 21 18:23:22 2015 |
Hao Yin | | | | Noise Injection LV cable | (TestNr. 15)
injecting sin wave into LV at different |
|
46
|
Fri May 22 12:01:32 2015 |
Hao Yin | | | | CMC injection LV 10V | Comparison w/o filter (LC) connected to
-z_n side.
Mateo has the results. |
|
51
|
Mon Nov 30 15:12:19 2015 |
Hao Yin | | | | FIR_ADC config | FIR filter and ADC delay test:
ADC delay and FIR filter with and
without cooling to reproduce error detected |
|
1
|
Fri Apr 18 17:23:26 2008 |
Markus Friedl | SPS Testbeam June08 | hybrid | hybrid 01 | Noise of hybrid 01, sensor fully bonded, no HV | HV bias not yet glued to backplane |
|
15
|
Wed Oct 7 14:23:35 2009 |
Dieter Uhl | BELLE Upgrade | hybrid | #4 | hybrid-pitchadapter | opens at upper coat
|
|
16
|
Wed Oct 7 14:24:06 2009 |
Dieter Uhl | BELLE Upgrade | hybrid | #5 | hybrid-pitchadapter | shorts at upper coat
|
|
2
|
Tue Apr 22 19:34:09 2008 |
Markus Friedl | SPS Testbeam June08 | module | hybrid 01 | Properties of hybrid 01, sensor fully bonded, HV=100V | HV bias glued to backplane, HV=100V |
6x |
5
|
Wed Apr 30 16:52:17 2008 |
Markus Friedl | BELLE Upgrade | module | micron | micron sensor glued to frame | soeben haben wir den micron-DSSD (double metal
layer) in den 2-teiligen rahmen geklebt und
auf beiden seiten
|
|
6
|
Wed May 7 15:24:49 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 10/02 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100V) = 19.1 nA
Ibias (200V) = 23.7 nA |
12x |
9
|
Wed May 7 15:26:24 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 20/09 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100 V) = 25.1 nA
Ibias (200 V) = 31.4 nA |
12x |
8
|
Wed May 7 15:40:07 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 07/07 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100 V) = 20.2 nA
Ibias (200 V) = 21.9 nA |
12x |
7
|
Wed May 7 16:12:58 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 12/08 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100 V) = 22.2 nA
Ibias (200 V) = 26.5 nA |
12x |
10
|
Wed May 7 19:05:08 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 04/04 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100 V) = 27.8 nA
Ibias (200 V) = 32.7 nA |
12x |
11
|
Fri May 9 09:56:15 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 06/03 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100 V) = 26.5 nA
Ibias (200 V) = 37.8 nA |
12x |
12
|
Fri May 9 10:00:34 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 03/10 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100 V) = 18.9 nA
Ibias (200 V) = 25.5 nA |
12x |
13
|
Fri May 9 10:04:26 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 05/05 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100 V) = 18.0 nA
Ibias (200 V) = 23.6 nA |
12x |