L5 Ladder Test

folder: /mnt/data/ITA_NOISE_TESTS/Ladder_test

Setup: ladder only, noise injection on one hybrid (injection point = cable between hybrid and junction board, see attachment 1).

Run Name Injection map (2000 Events):
fw_all: GND, 1.25V, 2.5V (injection into the p-side): (TestNr. 2)
0: baseline
1: baseline
2: 5MHz 1mA
3: 5MHz 2mA
4: 5MHz 5mA
5: 5MHz 3mA
6: 1MHz 2mA
7: 500kHz 2mA
8: 200kHz 2mA
9: 400kHz 2mA
10: 400kHz 1mA
11: 400kHz 0.5mA
12: 700kHz 2mA
13: 700kHz 1mA
14: 800kHz 1mA
15: 2MHz 2mA
16: 3MHz 2mA
17: 7MHz 2mA
18: 8MHz 2mA
19: 10MHz 2mA
20: 15MHz 2mA
21: 20MHz 2mA
22: 20MHz 4mA
23: 30MHz 4mA
24: 40MHz 4mA
25: 40MHz 6mA
26: 50MHz 4mA
27: 80MHz 4mA

fw_n_all: GND, 1.25V, 2.5V (injection into the n-side): (TestNr. 3)
0: base_line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 2mA
8: 3MHz 2mA
9: 5MHz 2mA
10: 7MHz 2mA
11: 8MHz 2mA
12: 10MHz 2mA
13: 15MHz 2mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 4mA
17: 30MHz 6mA
18: 40MHz 6mA
19: 50MHz 6mA
20: 80MHz 6mA

ce_p_all: GND, 1.25V, 2.5V (injection into the n-side): (TestNr. 4)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 2mA
8: 2MHz 4mA
9: 3MHz 4mA
10: 5MHz 4mA
11: 7MHz 4mA
12: 8MHz 4mA
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

noise coupling to -z bw and !!!

ce_n_all: GND, 1.25V, 2.5V (injection into the n-side): (TestNr. 5)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 2mA
8: 2MHz 4mA
9: 3MHz 4mA
10: 5MHz 4mA
11: 7MHz 4mA
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

noise coupling to -z!!!

-z_p_all: GND, 1.25V, 2.5V (injection into the n-side): (TestNr. 6)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 2mA (other sensors heavily disturbed)
8: 2MHz 4mA
9: 3MHz 4mA
10: 5MHz 4mA
11: 7MHz 4mA
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

-z_n_all: GND, 1.25V, 2.5V (injection into the n-side): (TestNr. 7)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 4mA (other sensors heavily disturbed)
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

bw_p_all: GND, 1.25V, 2.5V (injection into the n-side): (TestNr. 8)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 4mA (other sensors heavily disturbed)
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

bw_n_all: GND, 1.25V, 2.5V (injection into the n-side): (TestNr. 9)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 4mA (other sensors heavily disturbed)
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

-z_n_2.5V: 2.5V (injection into the n-side): (TestNr. 10)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 4mA (other sensors heavily disturbed)
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

-z_n_2.5V: 1.5V (injection into the n-side): (TestNr. 11)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 4mA (other sensors heavily disturbed)
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

Sensor  on -z_n and fw_n still shows wings after the test...

-z_n_1.25V: 1.5V (injection into the n-side): (TestNr. 12)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 4mA (other sensors heavily disturbed)
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA (other sensors heavily disturbed)
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

-z_n_GND: GND (injection into the n-side): (TestNr. 13)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA (all sensors affected by the nosie)
7: 2MHz 4mA
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

-z_np_all: GND, 1.25V, 2.5V  (injection into the p and n-side): (TestNr. 14)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 4mA
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA
 

(TestNr. 15)

injecting sin wave into LV at different frequencies to analyse the output frequency and noise ground level after the junction borad.
only one group of DC/DC are connected. the readout is performed at the cable between junction board and -z_n hybrid (1.25V, 2.5V and GND).
the sin wave injection is performed adjacent the LV power connection, see appendix 1.

performed 2 sets of measurements: one w HV and one wo HV.
results have been recorded by Mateo.

During measurements the APVs of 3 out of four sensors (6 hybrids) has been resetet. Some also showed a flat line at 200 ADC, indicating a disturbance at the analog level translater.
A more detailed measurement to simulate the case mentioned above will be performed.

Comparison w/o filter (LC) connected to -z_n side.

Mateo has the results.

FIR filter and ADC delay test:
ADC delay and FIR filter with and without cooling to reproduce error detected during CERN beam test 2015.
 

Measurements wo cooling:

Measurements w cooling:

Mesurements w cooled configs: