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| HEPHY logbook of the Electronics Group, Page 3 of 4 |
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| New entries since: | Thu Jan 1 01:00:00 1970 | |
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 Mon Nov 30 17:23:51 2015, Hao Yin, Belle II, system, HardwareRun001, 
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Mon Nov 30 17:47:54 2015, Hao Yin, Belle II, system, HardwareRun002,
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Mon Nov 30 18:32:13 2015, Hao Yin, Belle II, system, ADC Delay Scan Cold,
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Mon Nov 30 18:44:04 2015, Hao Yin, Belle II, system, FIRRun_Cold,
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Mon Nov 30 18:45:49 2015, Hao Yin, Belle II, system, PedestalRun_Cold,
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Mon Nov 30 18:49:23 2015, Hao Yin, Belle II, system, Hardware_Cold,
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Mon Nov 30 19:01:54 2015, Hao Yin, Belle II, system, Hardware_Cold,
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Mon Nov 30 19:48:05 2015, Hao Yin, Belle II, system, Hardware_Room_With_Cold_I2C,
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Mon Nov 30 20:06:15 2015, Hao Yin, Belle II, system, Hardware_Room_With_Cold_I2C,
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Mon Nov 30 20:16:37 2015, Hao Yin, Belle II, system, Hardware_Room_With_Cold_I2C,
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Mon Nov 30 20:27:42 2015, Hao Yin, Belle II, system, Hardware_Room_With_Cold_I2C,
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Mon Nov 30 22:35:41 2015, Hao Yin, Belle II, system, Hardware_Room_With_Cold_I2C,
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Wed Apr 30 16:52:17 2008, Markus Friedl, BELLE Upgrade, module, micron, micron sensor glued to frame
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Tue May 20 14:27:50 2008, Markus Friedl, BELLE Upgrade, source, micron, analysis results of source test 9x
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Wed Oct 7 14:23:35 2009, Dieter Uhl, BELLE Upgrade, hybrid, #4, hybrid-pitchadapter
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Wed Oct 7 14:24:06 2009, Dieter Uhl, BELLE Upgrade, hybrid, #5, hybrid-pitchadapter
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Sun Jul 4 05:48:36 2010, Christian Irmler, BELLE Upgrade, source, Origami 6 - module 1, run002: first analysis results 7x
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Tue May 19 09:31:50 2015, Hao Yin, , , , Noise Test ITA
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Tue May 19 10:08:53 2015, Hao Yin, , , , FADC system setup success
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Tue May 19 13:42:04 2015, Hao Yin, , , , L6 Noise inJection Setup
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