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  Testbeam at DESY in 2023, Page 22 of 26  Not logged in ELOG logo
ID Date Author Subject Run Number DUTdown Wafer HV Fluence Resistivity Beam Energy Rate Setting Particle Type Data t-Start t-Stop Duration_min
  427   Fri Jul 14 16:26:16 2023 tb-crewirradiated RD50-MPW3unknown911e141.9K4.2Low Flux LowelectronGood   
thr 1.225V, -8.6 deg C, was running in noise, deactivated lower 30 rows
  428   Fri Jul 14 16:45:29 2023 tb-crewirradiated1280RD50-MPW3unknown911e141.9K4.2Low Flux LowelectronGood14.07.2023 16:21:4714.07.2023 16:40:4919
automatic log for run 1280
Comment:
thr 1.225V, -8.6 deg C
  429   Fri Jul 14 17:32:50 2023 tb-crewirradiated1281RD50-MPW3unknown911e141.9K4.2Low Flux LowelectronGood14.07.2023 16:41:4814.07.2023 17:28:1046
automatic log for run 1281
Comment:
thr 1.2V, -1 deg C
  430   Fri Jul 14 17:50:57 2023 tb-crewirradiated1282RD50-MPW3unknown911e141.9K4.2Low Flux LowelectronGood14.07.2023 17:29:3114.07.2023 17:46:1716
automatic log for run 1282
Comment:
thr 1.17V, -0.6 deg C
  431   Fri Jul 14 17:55:30 2023 tb-crewirradiated1283RD50-MPW3unknown911e141.9K4.2Low Flux LowelectronGood14.07.2023 17:49:3714.07.2023 17:50:491
automatic log for run 1283
Comment:
thr 1.15V, -0.6 deg C -> lil bit of noise
  432   Fri Jul 14 21:00:23 2023 tb-crewirradiated1284RD50-MPW3unknown911e141.9K4.2Low Flux LowelectronGood14.07.2023 17:53:5914.07.2023 20:55:42181
automatic log for run 1284
Comment:
thr 1.15V, -0.6 deg C -> lil bit of noise
  433   Sat Jul 15 00:46:44 2023 tb-crewirradiated1285RD50-MPW3unknown911e141.9K4.2Low Flux LowelectronGood14.07.2023 21:06:2615.07.2023 00:42:03215
automatic log for run 1285
Comment:
thr 1.15V, -0.6 deg C -> lil bit of noise
  434   Sat Jul 15 09:26:35 2023 tb-crewirradiated1286RD50-MPW3unknown911e141.9K4.2Low Flux LowelectronGood15.07.2023 00:42:1615.07.2023 09:21:52519
automatic log for run 1286
Comment:
thr 1.15V, -0.6 deg C -> lil bit of noise
  435   Sat Jul 15 10:02:11 2023 tb-crewirradiated1287RD50-MPW3unknown911e141.9K4.2Low Flux LowelectronGood15.07.2023 09:22:0615.07.2023 09:57:2835
automatic log for run 1287
Comment:
thr 1.15V, -0.6 deg C -> lil bit of noise
  436   Sat Jul 15 10:02:57 2023 tb-crewirradiated1288RD50-MPW3unknown911e141.9K4.2Low Flux LowelectronGood15.07.2023 09:58:1115.07.2023 09:58:140
automatic log for run 1288
Comment:
thr 1.1V, -0.5 deg C
  437   Sat Jul 15 10:03:28 2023 tb-crewirradiated RD50-MPW3unknown911e141.9K4.2Low Flux LowelectronGood   
that was noise
  438   Sat Jul 15 10:04:38 2023 tb-crewirradiated RD50-MPW3unknown911e141.9K4.2Low Flux LowelectronGood   
masking all rows below row 50
  439   Sat Jul 15 10:06:15 2023 tb-crewirradiated1289RD50-MPW3unknown911e141.9K4.2Low Flux LowelectronGood15.07.2023 10:00:5215.07.2023 10:01:320
automatic log for run 1289
Comment:
thr 1.12V, -0.5 deg C, only rows 63 -> 50 active
  440   Sat Jul 15 10:06:28 2023 tb-crewirradiated RD50-MPW3unknown911e141.9K4.2Low Flux LowelectronGood   
there is a noisy pixel
  441   Sat Jul 15 10:14:43 2023 tb-crewirradiated1290RD50-MPW3unknown911e141.9K4.2Low Flux LowelectronGood15.07.2023 10:04:0415.07.2023 10:10:005
automatic log for run 1290
Comment:
masked pixel 52:42, looks better now
  442   Sat Jul 15 10:22:32 2023 tb-crewirradiated RD50-MPW3unknown1051e141.9K4.2Low Flux LowelectronGood   
changed bias, is short before breakdown now
  443   Sat Jul 15 10:34:24 2023 tb-crewirradiated1291RD50-MPW3unknown1051e141.9K4.2Low Flux LowelectronGood15.07.2023 10:19:0115.07.2023 10:29:4210
automatic log for run 1291
Comment:
  444   Sat Jul 15 10:39:00 2023 tb-crewirradiated1292RD50-MPW3unknown1051e141.9K4.2Low Flux LowelectronGood15.07.2023 10:30:1615.07.2023 10:34:174
automatic log for run 1292
Comment:
thr = 1.1V, theres a noisy pixel
  445   Sat Jul 15 10:40:09 2023 tb-crewirradiated RD50-MPW3unknown1051e141.9K4.2Low Flux LowelectronGood   
pixel 57:30 is noisy, masking it
  446   Sat Jul 15 10:51:31 2023 tb-crewirradiated1293RD50-MPW3unknown1051e141.9K4.2Low Flux LowelectronGood15.07.2023 10:36:4315.07.2023 10:46:4910
automatic log for run 1293
Comment:
this run might be used for analysis of efficiency of irradiated sensor
lowest threshold, highest bias
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