Tue Apr 22 19:34:09 2008, Markus Friedl, SPS Testbeam June08, module, hybrid 01, Properties of hybrid 01, sensor fully bonded, HV=100V 6x
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HV bias glued to backplane, HV=100V |
Wed Apr 23 13:37:18 2008, Markus Friedl, SPS Testbeam June08, source, hybrid 01, analysis results of source test
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Ignore the "KEK November 2007" title - that's a legacy and is already changed :-)
As of now, there is no distinction in 16 separate zones. However, the gaps between the the zones are clearly visible in the Hit Profile, as the edge strips |
Wed Apr 30 16:52:17 2008, Markus Friedl, BELLE Upgrade, module, micron, micron sensor glued to frame
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soeben haben wir den micron-DSSD (double metal layer) in den 2-teiligen rahmen geklebt und auf beiden seiten
temporäre kapton-stückerln aufgeklebt, über die bias appliziert werden kann. nach trocknung und bonden der
bias-verbindungen (montag, 5.5.2008) wird dieser für sensor-tests zur verfügung stehen. |
Tue May 20 14:27:50 2008, Markus Friedl, BELLE Upgrade, source, micron, analysis results of source test 9x
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*** NOTE: AFTER THIS MEASUREMENT WE REALIZED THAT BIASING WAS NOT DONE PROPERLY
HENCE THE RESULTS BELOW ARE NOT RELIABLE
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