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  HEPHY logbook of the Electronics Group, Page 4 of 4  Not logged in ELOG logo
New entries since:Thu Jan 1 01:00:00 1970
ID Date Author Project Measurement Typedown Object ID Subject
  44   Wed May 20 10:12:12 2015 Hao Yin   Ladder RLC test (CMC Injection)

L5 Ladder Test

folder: /mnt/data/ITA_NOISE_TESTS/Ladder_test

Setup: ladder only, noise injection on one hybrid (injection point = cable between hybrid and junction board, see attachment 1).

Run Name Injection map (2000 Events):
fw_all: GND, 1.25V, 2.5V (injection into the p-side): (TestNr. 2)
0: baseline
1: baseline
2: 5MHz 1mA
3: 5MHz 2mA
4: 5MHz 5mA
5: 5MHz 3mA
6: 1MHz 2mA
7: 500kHz 2mA
8: 200kHz 2mA
9: 400kHz 2mA
10: 400kHz 1mA
11: 400kHz 0.5mA
12: 700kHz 2mA
13: 700kHz 1mA
14: 800kHz 1mA
15: 2MHz 2mA
16: 3MHz 2mA
17: 7MHz 2mA
18: 8MHz 2mA
19: 10MHz 2mA
20: 15MHz 2mA
21: 20MHz 2mA
22: 20MHz 4mA
23: 30MHz 4mA
24: 40MHz 4mA
25: 40MHz 6mA
26: 50MHz 4mA
27: 80MHz 4mA

fw_n_all: GND, 1.25V, 2.5V (injection into the n-side): (TestNr. 3)
0: base_line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 2mA
8: 3MHz 2mA
9: 5MHz 2mA
10: 7MHz 2mA
11: 8MHz 2mA
12: 10MHz 2mA
13: 15MHz 2mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 4mA
17: 30MHz 6mA
18: 40MHz 6mA
19: 50MHz 6mA
20: 80MHz 6mA

ce_p_all: GND, 1.25V, 2.5V (injection into the n-side): (TestNr. 4)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 2mA
8: 2MHz 4mA
9: 3MHz 4mA
10: 5MHz 4mA
11: 7MHz 4mA
12: 8MHz 4mA
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

noise coupling to -z bw and !!!


ce_n_all: GND, 1.25V, 2.5V (injection into the n-side): (TestNr. 5)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 2mA
8: 2MHz 4mA
9: 3MHz 4mA
10: 5MHz 4mA
11: 7MHz 4mA
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

noise coupling to -z!!!

-z_p_all: GND, 1.25V, 2.5V (injection into the n-side): (TestNr. 6)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 2mA (other sensors heavily disturbed)
8: 2MHz 4mA
9: 3MHz 4mA
10: 5MHz 4mA
11: 7MHz 4mA
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

-z_n_all: GND, 1.25V, 2.5V (injection into the n-side): (TestNr. 7)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 4mA (other sensors heavily disturbed)
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

bw_p_all: GND, 1.25V, 2.5V (injection into the n-side): (TestNr. 8)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 4mA (other sensors heavily disturbed)
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

bw_n_all: GND, 1.25V, 2.5V (injection into the n-side): (TestNr. 9)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 4mA (other sensors heavily disturbed)
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

-z_n_2.5V: 2.5V (injection into the n-side): (TestNr. 10)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 4mA (other sensors heavily disturbed)
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

-z_n_2.5V: 1.5V (injection into the n-side): (TestNr. 11)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 4mA (other sensors heavily disturbed)
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

Sensor  on -z_n and fw_n still shows wings after the test...

-z_n_1.25V: 1.5V (injection into the n-side): (TestNr. 12)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 4mA (other sensors heavily disturbed)
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA (other sensors heavily disturbed)
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA


-z_n_GND: GND (injection into the n-side): (TestNr. 13)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA (all sensors affected by the nosie)
7: 2MHz 4mA
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA

-z_np_all: GND, 1.25V, 2.5V  (injection into the p and n-side): (TestNr. 14)
0: base line
1: 200kHz 2mA
2: 400kHz 2mA
3: 500kHz 2mA
4: 700kHz 1mA
5: 800kHz 1mA
6: 1MHz 2mA
7: 2MHz 4mA
8: 3MHz 4mA
9: 5MHz 4mA
10: 7MHz 4mA
(skipping one)
12: 8MHz 4mA (amplifier)
13: 10MHz 4mA
14: 15MHz 4mA
15: 20MHz 4mA
16: 30MHz 6mA
17: 40MHz 6mA
18: 50MHz 6mA
19: 80MHz 6mA
 

  45   Thu May 21 18:23:22 2015 Hao Yin   Noise Injection LV cable

(TestNr. 15)

injecting sin wave into LV at different frequencies to analyse the output frequency and noise ground level after the junction borad.
only one group of DC/DC are connected. the readout is performed at the cable between junction board and -z_n hybrid (1.25V, 2.5V and GND).
the sin wave injection is performed adjacent the LV power connection, see appendix 1.

performed 2 sets of measurements: one w HV and one wo HV.
results have been recorded by Mateo.

During measurements the APVs of 3 out of four sensors (6 hybrids) has been resetet. Some also showed a flat line at 200 ADC, indicating a disturbance at the analog level translater.
A more detailed measurement to simulate the case mentioned above will be performed.

 

Attachment 1: P1000717.JPG
P1000717.JPG
  46   Fri May 22 12:01:32 2015 Hao Yin   CMC injection LV 10V

Comparison w/o filter (LC) connected to -z_n side.

Mateo has the results.

  51   Mon Nov 30 15:12:19 2015 Hao Yin   FIR_ADC config

FIR filter and ADC delay test:
ADC delay and FIR filter with and without cooling to reproduce error detected during CERN beam test 2015.
 

Measurements wo cooling:

Measurements w cooling:

Mesurements w cooled configs:

ELOG V3.1.4-966e3dd