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  HEPHY logbook of the Electronics Group, Page 4 of 4  Not logged in ELOG logo
ID Date Author Project Measurement Type Object IDup Subject
  8   Wed May 7 15:40:07 2008 Christian IrmlerSPS Testbeam June08modulemodule 07/07properties (noise, intcal), APVs bonded to the sensor
Module tested with 1 and 2 rows bonded to the sensor, respectively. HV = 100 V Ibias (100 V) = 20.2 nA Ibias (200 V) = 21.9 nA
  6   Wed May 7 15:24:49 2008 Christian IrmlerSPS Testbeam June08modulemodule 10/02properties (noise, intcal), APVs bonded to the sensor
Module tested with 1 and 2 rows bonded to the sensor, respectively. HV = 100 V Ibias (100V) = 19.1 nA Ibias (200V) = 23.7 nA
  7   Wed May 7 16:12:58 2008 Christian IrmlerSPS Testbeam June08modulemodule 12/08properties (noise, intcal), APVs bonded to the sensor
Module tested with 1 and 2 rows bonded to the sensor, respectively. HV = 100 V Ibias (100 V) = 22.2 nA Ibias (200 V) = 26.5 nA
  9   Wed May 7 15:26:24 2008 Christian IrmlerSPS Testbeam June08modulemodule 20/09properties (noise, intcal), APVs bonded to the sensor
Module tested with 1 and 2 rows bonded to the sensor, respectively. HV = 100 V Ibias (100 V) = 25.1 nA Ibias (200 V) = 31.4 nA
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