|  | ID | Date | Author | Project | Measurement Type | Object ID | Subject  | Text |  | 
|  | 3 | Wed Apr 23 13:05:05 2008 | Christian Irmler | SPS Testbeam June08 | source | hybrid 01 | time correlation between TDC and sensor measurement -> 3.1 ns RMS |  |   | 
|  | 17 | Sun Jul  4 05:48:36 2010 | Christian Irmler | BELLE Upgrade | source | Origami 6 - module 1 | run002: first analysis results | Run name: run002 
 Run type: 0 (Hardware (Normal Run))
 | 7x   | 
|  | 6 | Wed May  7 15:24:49 2008 | Christian Irmler | SPS Testbeam June08 | module | module 10/02 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to the sensor, respectively.
 HV = 100 V
 Ibias
 (100V) = 19.1 nA
 Ibias (200V) = 23.7 nA
 | 12x   | 
|  | 9 | Wed May  7 15:26:24 2008 | Christian Irmler | SPS Testbeam June08 | module | module 20/09 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to the sensor, respectively.
 HV = 100 V
 Ibias
 (100 V) = 25.1 nA
 Ibias (200 V) = 31.4 nA
 | 12x   | 
|  | 8 | Wed May  7 15:40:07 2008 | Christian Irmler | SPS Testbeam June08 | module | module 07/07 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to the sensor, respectively.
 HV = 100 V
 Ibias
 (100 V) = 20.2 nA
 Ibias (200 V) = 21.9 nA
 | 12x   | 
|  | 7 | Wed May  7 16:12:58 2008 | Christian Irmler | SPS Testbeam June08 | module | module 12/08 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to the sensor, respectively.
 HV = 100 V
 Ibias
 (100 V) = 22.2 nA
 Ibias (200 V) = 26.5 nA
 | 12x   | 
|  | 10 | Wed May  7 19:05:08 2008 | Christian Irmler | SPS Testbeam June08 | module | module 04/04 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to the sensor, respectively.
 HV = 100 V
 Ibias
 (100 V) = 27.8 nA
 Ibias (200 V) = 32.7 nA
 | 12x   | 
|  | 11 | Fri May  9 09:56:15 2008 | Christian Irmler | SPS Testbeam June08 | module | module 06/03 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to the sensor, respectively.
 HV = 100 V
 Ibias
 (100 V) = 26.5 nA
 Ibias (200 V) = 37.8 nA
 | 12x   | 
|  | 12 | Fri May  9 10:00:34 2008 | Christian Irmler | SPS Testbeam June08 | module | module 03/10 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to the sensor, respectively.
 HV = 100 V
 Ibias
 (100 V) = 18.9 nA
 Ibias (200 V) = 25.5 nA
 | 12x   | 
|  | 13 | Fri May  9 10:04:26 2008 | Christian Irmler | SPS Testbeam June08 | module | module 05/05 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to the sensor, respectively.
 HV = 100 V
 Ibias
 (100 V) = 18.0 nA
 Ibias (200 V) = 23.6 nA
 | 12x   | 
|  | 5 | Wed Apr 30 16:52:17 2008 | Markus Friedl | BELLE Upgrade | module | micron | micron sensor glued to frame | soeben haben wir den micron-DSSD (double metal layer) in den 2-teiligen rahmen geklebt und
 auf beiden seiten
 |  | 
|  | 15 | Wed Oct  7 14:23:35 2009 | Dieter Uhl | BELLE Upgrade | hybrid | #4 | hybrid-pitchadapter | opens at upper coat 
 |      | 
|  | 16 | Wed Oct  7 14:24:06 2009 | Dieter Uhl | BELLE Upgrade | hybrid | #5 | hybrid-pitchadapter | shorts at upper coat 
 |      | 
|  | 4 | Wed Apr 23 13:37:18 2008 | Markus Friedl | SPS Testbeam June08 | source | hybrid 01 | analysis results of source test | Ignore the "KEK November 2007" title - that's a legacy and is already changed :-)
 
 |      | 
|  | 14 | Tue May 20 14:27:50 2008 | Markus Friedl | BELLE Upgrade | source | micron | analysis results of source test | *** NOTE: AFTER THIS MEASUREMENT WE REALIZED
 THAT BIASING WAS NOT DONE PROPERLY
 | 9x   | 
|  |  50 | Fri May 29 11:47:56 2015 | Hao Yin | Belle II | system | PS Filter | Testing PS LV filter and quantifying the required min noise lvl | Data of this entry is recorded in the folder: LV315kHz_Injections
 Injecting noise to LV with a freq.
 |  | 
|  | 35 | Thu Jun  5 10:34:29 2014 | Benedikt Würkner | Belle II | source | Silc Module | Silc Angle Measurement 7° | Measured the Silc 03/10 Module using the Sr90 Source to have a comparison for the
 Eta-Distribution at different angles.
 |  | 
|  | 34 | Thu Jun  5 10:34:06 2014 | Benedikt Würkner | Belle II | source | Silc Module | Silc Angle Measurement 4° | Measured the Silc 03/10 Module using the Sr90 Source to have a comparison for the
 Eta-Distribution at different angles.
 |  | 
|  | 33 | Thu Jun  5 10:33:46 2014 | Benedikt Würkner | Belle II | source | Silc Module | Silc Angle Measurement 1° | Measured the Silc 03/10 Module using the Sr90 Source to have a comparison for the
 Eta-Distribution at different angles.
 |  | 
|  | 36 | Thu Jun  5 10:34:45 2014 | Benedikt Würkner | Belle II | source | Silc Module | Silc Angle Measurement 10° | Measured the Silc 03/10 Module using the Sr90 Source to have a comparison for the
 Eta-Distribution at different angles.
 |  |