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HEPHY logbook of the Electronics Group, Page 1 of 4  Not logged in

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Full | Summary | Threaded | Collapse | Expand     -- All entries -- Last day Last 3 Days Last week Last month Last 3 Months Last 6 Months Last Year -- Type -- Common Measurement -- Project -- SPS Testbeam June08 Belle II PixelFED -- Measurement Type -- hybrid module source system  64 Entries

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Selected entries:  Tracker Sensor QC HGC Sensor QC Process QC Longterm Visual Inspection Process QC OLD SQC PQC P3 HGC Klimakammer microscopes infrastructure test cleanroom lasersetup module assembly testbeam-MA2023 testbeam-MA2021 testbeam-MA2020 testbeam-MA2019 testbeam-rd50-desy-Oct2024 testbeam-RD50-DESY-Apr2024 testbeam-RD50-DESY-Jul2023 testbeam-RD50-CERN-Oct2022 testbeam-DESY-Oct2017 testbeam-DESY-April2017 testbeam-SPS2015 testbeam-SPS2014 testbeam-DESY14 testbeam-SPS12 testbeam-SPS11 testbeam-SPS10 testbeam-SPS09 testbeam-SPS08 LP-TPC SiDDaTA scratch testbeam-MA2018 testbeam-MA2024

Wed Apr 23 13:05:05 2008, Christian Irmler, SPS Testbeam June08, source, hybrid 01, time correlation between TDC and sensor measurement -> 3.1 ns RMS    Sun Jul 4 05:48:36 2010, Christian Irmler, BELLE Upgrade, source, Origami 6 - module 1, run002: first analysis results 7x   Wed May 7 15:24:49 2008, Christian Irmler, SPS Testbeam June08, module, module 10/02, properties (noise, intcal), APVs bonded to the sensor 12x   Wed May 7 15:26:24 2008, Christian Irmler, SPS Testbeam June08, module, module 20/09, properties (noise, intcal), APVs bonded to the sensor 12x   Wed May 7 15:40:07 2008, Christian Irmler, SPS Testbeam June08, module, module 07/07, properties (noise, intcal), APVs bonded to the sensor 12x   Wed May 7 16:12:58 2008, Christian Irmler, SPS Testbeam June08, module, module 12/08, properties (noise, intcal), APVs bonded to the sensor 12x   Wed May 7 19:05:08 2008, Christian Irmler, SPS Testbeam June08, module, module 04/04, properties (noise, intcal), APVs bonded to the sensor 12x   Fri May 9 09:56:15 2008, Christian Irmler, SPS Testbeam June08, module, module 06/03, properties (noise, intcal), APVs bonded to the sensor 12x   Fri May 9 10:00:34 2008, Christian Irmler, SPS Testbeam June08, module, module 03/10, properties (noise, intcal), APVs bonded to the sensor 12x   Fri May 9 10:04:26 2008, Christian Irmler, SPS Testbeam June08, module, module 05/05, properties (noise, intcal), APVs bonded to the sensor 12x   Wed Apr 30 16:52:17 2008, Markus Friedl, BELLE Upgrade, module, micron, micron sensor glued to frame    Wed Oct 7 14:23:35 2009, Dieter Uhl, BELLE Upgrade, hybrid, #4, hybrid-pitchadapter    Wed Oct 7 14:24:06 2009, Dieter Uhl, BELLE Upgrade, hybrid, #5, hybrid-pitchadapter    Wed Apr 23 13:37:18 2008, Markus Friedl, SPS Testbeam June08, source, hybrid 01, analysis results of source test    Tue May 20 14:27:50 2008, Markus Friedl, BELLE Upgrade, source, micron, analysis results of source test 9x     Fri May 29 11:47:56 2015, Hao Yin, Belle II, system, PS Filter, Testing PS LV filter and quantifying the required min noise lvl    Thu Jun 5 10:34:29 2014, Benedikt Würkner, Belle II, source, Silc Module, Silc Angle Measurement 7°    Thu Jun 5 10:34:06 2014, Benedikt Würkner, Belle II, source, Silc Module, Silc Angle Measurement 4°    Thu Jun 5 10:33:46 2014, Benedikt Würkner, Belle II, source, Silc Module, Silc Angle Measurement 1°    Thu Jun 5 10:34:45 2014, Benedikt Würkner, Belle II, source, Silc Module, Silc Angle Measurement 10°

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