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  HEPHY logbook of the Electronics Group, Page 1 of 4  Not logged in ELOG logo
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Entry  Wed Apr 23 13:05:05 2008, Christian Irmler, SPS Testbeam June08, source, hybrid 01, time correlation between TDC and sensor measurement -> 3.1 ns RMS vie_run001_tpeak_vs_TDC.gif
Entry  Sun Jul 4 05:48:36 2010, Christian Irmler, BELLE Upgrade, source, Origami 6 - module 1, run002: first analysis results 7x
Entry  Wed May 7 15:24:49 2008, Christian Irmler, SPS Testbeam June08, module, module 10/02, properties (noise, intcal), APVs bonded to the sensor 12x
Entry  Wed May 7 15:26:24 2008, Christian Irmler, SPS Testbeam June08, module, module 20/09, properties (noise, intcal), APVs bonded to the sensor 12x
Entry  Wed May 7 15:40:07 2008, Christian Irmler, SPS Testbeam June08, module, module 07/07, properties (noise, intcal), APVs bonded to the sensor 12x
Entry  Wed May 7 16:12:58 2008, Christian Irmler, SPS Testbeam June08, module, module 12/08, properties (noise, intcal), APVs bonded to the sensor 12x
Entry  Wed May 7 19:05:08 2008, Christian Irmler, SPS Testbeam June08, module, module 04/04, properties (noise, intcal), APVs bonded to the sensor 12x
Entry  Fri May 9 09:56:15 2008, Christian Irmler, SPS Testbeam June08, module, module 06/03, properties (noise, intcal), APVs bonded to the sensor 12x
Entry  Fri May 9 10:00:34 2008, Christian Irmler, SPS Testbeam June08, module, module 03/10, properties (noise, intcal), APVs bonded to the sensor 12x
Entry  Fri May 9 10:04:26 2008, Christian Irmler, SPS Testbeam June08, module, module 05/05, properties (noise, intcal), APVs bonded to the sensor 12x
Entry  Wed Apr 30 16:52:17 2008, Markus Friedl, BELLE Upgrade, module, micron, micron sensor glued to frame 
Entry  Wed Oct 7 14:23:35 2009, Dieter Uhl, BELLE Upgrade, hybrid, #4, hybrid-pitchadapter pitchadapter4_lower_coat.gifpitchadapter4_lower_coat_opens.gifpitchadapter4_upper_coat.gifpitchadapter4_upper_coat_opens.gif
Entry  Wed Oct 7 14:24:06 2009, Dieter Uhl, BELLE Upgrade, hybrid, #5, hybrid-pitchadapter pitchadapter5_lower_coat_opens.gifpitchadapter5_lower_coat.gifpitchadapter5_upper_coat_opens.gifpitchadapter5_upper_coat.gif
Entry  Wed Apr 23 13:37:18 2008, Markus Friedl, SPS Testbeam June08, source, hybrid 01, analysis results of source test vie_run001_cluster_sig_0.gifvie_run001_cluster_noi_0.gifvie_run001_cluster_hit_0.gifvie_run001_cluster_clw_0.gif
Entry  Tue May 20 14:27:50 2008, Markus Friedl, BELLE Upgrade, source, micron, analysis results of source test 9x
Entry is currently edited by Hao Yin on 255.255.255.255  Entry  Fri May 29 11:47:56 2015, Hao Yin, Belle II, system, PS Filter, Testing PS LV filter and quantifying the required min noise lvl 
Entry  Thu Jun 5 10:34:29 2014, Benedikt Würkner, Belle II, source, Silc Module, Silc Angle Measurement 7° 
Entry  Thu Jun 5 10:34:06 2014, Benedikt Würkner, Belle II, source, Silc Module, Silc Angle Measurement 4° 
Entry  Thu Jun 5 10:33:46 2014, Benedikt Würkner, Belle II, source, Silc Module, Silc Angle Measurement 1° 
Entry  Thu Jun 5 10:34:45 2014, Benedikt Würkner, Belle II, source, Silc Module, Silc Angle Measurement 10° 
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