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Full | Summary | Threaded     -- All entries -- Last day Last 3 Days Last week Last month Last 3 Months Last 6 Months Last Year -- Type -- Common Measurement -- Project -- SPS Testbeam June08 Belle II PixelFED -- Measurement Type -- hybrid module source system  64 Entries

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Selected entries:  Tracker Sensor QC HGC Sensor QC Process QC Longterm Visual Inspection Process QC OLD SQC PQC P3 HGC Klimakammer microscopes infrastructure test cleanroom lasersetup module assembly testbeam-MA2023 testbeam-MA2021 testbeam-MA2020 testbeam-MA2019 testbeam-rd50-desy-Jul2025 testbeam-rd50-desy-Oct2024 testbeam-RD50-DESY-Apr2024 testbeam-RD50-DESY-Jul2023 testbeam-RD50-CERN-Oct2022 testbeam-DESY-Oct2017 testbeam-DESY-April2017 testbeam-SPS2015 testbeam-SPS2014 testbeam-DESY14 testbeam-SPS12 testbeam-SPS11 testbeam-SPS10 testbeam-SPS09 testbeam-SPS08 LP-TPC SiDDaTA scratch testbeam-MA2018 testbeam-MA2024 testbeam-MA2025

ID Date Author Project Measurement Type Object ID Subject Text   9   Wed May 7 15:26:24 2008 Christian Irmler SPS Testbeam June08 module module 20/09 properties (noise, intcal), APVs bonded to the sensor Module tested with 1 and 2 rows bonded to the sensor, respectively.  HV = 100 V Ibias (100 V) = 25.1 nA Ibias (200 V) = 31.4 nA  12x    7   Wed May 7 16:12:58 2008 Christian Irmler SPS Testbeam June08 module module 12/08 properties (noise, intcal), APVs bonded to the sensor Module tested with 1 and 2 rows bonded to the sensor, respectively.  HV = 100 V Ibias (100 V) = 22.2 nA Ibias (200 V) = 26.5 nA  12x    6   Wed May 7 15:24:49 2008 Christian Irmler SPS Testbeam June08 module module 10/02 properties (noise, intcal), APVs bonded to the sensor Module tested with 1 and 2 rows bonded to the sensor, respectively. HV = 100 V Ibias (100V) = 19.1 nA Ibias (200V) = 23.7 nA  12x    8   Wed May 7 15:40:07 2008 Christian Irmler SPS Testbeam June08 module module 07/07 properties (noise, intcal), APVs bonded to the sensor Module tested with 1 and 2 rows bonded to the sensor, respectively.  HV = 100 V Ibias (100 V) = 20.2 nA Ibias (200 V) = 21.9 nA  12x    11   Fri May 9 09:56:15 2008 Christian Irmler SPS Testbeam June08 module module 06/03 properties (noise, intcal), APVs bonded to the sensor Module tested with 1 and 2 rows bonded to the sensor, respectively.  HV = 100 V Ibias (100 V) = 26.5 nA Ibias (200 V) = 37.8 nA  12x    13   Fri May 9 10:04:26 2008 Christian Irmler SPS Testbeam June08 module module 05/05 properties (noise, intcal), APVs bonded to the sensor Module tested with 1 and 2 rows bonded to the sensor, respectively.  HV = 100 V Ibias (100 V) = 18.0 nA Ibias (200 V) = 23.6 nA  12x    10   Wed May 7 19:05:08 2008 Christian Irmler SPS Testbeam June08 module module 04/04 properties (noise, intcal), APVs bonded to the sensor Module tested with 1 and 2 rows bonded to the sensor, respectively.  HV = 100 V Ibias (100 V) = 27.8 nA Ibias (200 V) = 32.7 nA  12x    12   Fri May 9 10:00:34 2008 Christian Irmler SPS Testbeam June08 module module 03/10 properties (noise, intcal), APVs bonded to the sensor Module tested with 1 and 2 rows bonded to the sensor, respectively.  HV = 100 V Ibias (100 V) = 18.9 nA Ibias (200 V) = 25.5 nA  12x    5   Wed Apr 30 16:52:17 2008 Markus Friedl BELLE Upgrade module micron micron sensor glued to frame soeben haben wir den micron-DSSD (double metal layer) in den 2-teiligen rahmen geklebt und auf beiden seiten      14   Tue May 20 14:27:50 2008 Markus Friedl BELLE Upgrade source micron analysis results of source test *** NOTE: AFTER THIS MEASUREMENT WE REALIZED THAT BIASING WAS NOT DONE PROPERLY  9x    1   Fri Apr 18 17:23:26 2008 Markus Friedl SPS Testbeam June08 hybrid hybrid 01 Noise of hybrid 01, sensor fully bonded, no HV HV bias not yet glued to backplane      2   Tue Apr 22 19:34:09 2008 Markus Friedl SPS Testbeam June08 module hybrid 01 Properties of hybrid 01, sensor fully bonded, HV=100V HV bias glued to backplane, HV=100V  6x    3   Wed Apr 23 13:05:05 2008 Christian Irmler SPS Testbeam June08 source hybrid 01 time correlation between TDC and sensor measurement -> 3.1 ns RMS        4   Wed Apr 23 13:37:18 2008 Markus Friedl SPS Testbeam June08 source hybrid 01 analysis results of source test Ignore the "KEK November 2007" title - that's a legacy and is already changed :-)      33   Thu Jun 5 10:33:46 2014 Benedikt Würkner Belle II source Silc Module Silc Angle Measurement 1° Measured the Silc 03/10 Module using the Sr90 Source to have a comparison for the Eta-Distribution at different angles.       34   Thu Jun 5 10:34:06 2014 Benedikt Würkner Belle II source Silc Module Silc Angle Measurement 4° Measured the Silc 03/10 Module using the Sr90 Source to have a comparison for the Eta-Distribution at different angles.       35   Thu Jun 5 10:34:29 2014 Benedikt Würkner Belle II source Silc Module Silc Angle Measurement 7° Measured the Silc 03/10 Module using the Sr90 Source to have a comparison for the Eta-Distribution at different angles.       36   Thu Jun 5 10:34:45 2014 Benedikt Würkner Belle II source Silc Module Silc Angle Measurement 10° Measured the Silc 03/10 Module using the Sr90 Source to have a comparison for the Eta-Distribution at different angles.       59   Mon Nov 30 18:45:49 2015 Hao Yin Belle II system PedestalRun_Cold   ADC Cold diff to hot: 1-3 adc delay config (max 1.5 ns), FIRRun_Cold_001        54   Mon Nov 30 17:13:47 2015 Hao Yin Belle II system PedestalRun   ADC Hot, FIRRun001 room temp pedrun

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