| ID |
Date |
Author |
Project |
Measurement Type |
Object ID |
Subject |
Text |
 |
|
3
|
Wed Apr 23 13:05:05 2008 |
Christian Irmler | SPS Testbeam June08 | source | hybrid 01 | time correlation between TDC and sensor measurement -> 3.1 ns RMS | |
|
|
17
|
Sun Jul 4 05:48:36 2010 |
Christian Irmler | BELLE Upgrade | source | Origami 6 - module 1 | run002: first analysis results | Run name: run002
Run type: 0 (Hardware (Normal Run)) |
7x |
|
6
|
Wed May 7 15:24:49 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 10/02 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100V) = 19.1 nA
Ibias (200V) = 23.7 nA |
12x |
|
9
|
Wed May 7 15:26:24 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 20/09 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100 V) = 25.1 nA
Ibias (200 V) = 31.4 nA |
12x |
|
8
|
Wed May 7 15:40:07 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 07/07 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100 V) = 20.2 nA
Ibias (200 V) = 21.9 nA |
12x |
|
7
|
Wed May 7 16:12:58 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 12/08 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100 V) = 22.2 nA
Ibias (200 V) = 26.5 nA |
12x |
|
10
|
Wed May 7 19:05:08 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 04/04 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100 V) = 27.8 nA
Ibias (200 V) = 32.7 nA |
12x |
|
11
|
Fri May 9 09:56:15 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 06/03 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100 V) = 26.5 nA
Ibias (200 V) = 37.8 nA |
12x |
|
12
|
Fri May 9 10:00:34 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 03/10 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100 V) = 18.9 nA
Ibias (200 V) = 25.5 nA |
12x |
|
13
|
Fri May 9 10:04:26 2008 |
Christian Irmler | SPS Testbeam June08 | module | module 05/05 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to
the sensor, respectively.
HV = 100 V
Ibias
(100 V) = 18.0 nA
Ibias (200 V) = 23.6 nA |
12x |
|
5
|
Wed Apr 30 16:52:17 2008 |
Markus Friedl | BELLE Upgrade | module | micron | micron sensor glued to frame | soeben haben wir den micron-DSSD (double metal
layer) in den 2-teiligen rahmen geklebt und
auf beiden seiten
|
|
|
15
|
Wed Oct 7 14:23:35 2009 |
Dieter Uhl | BELLE Upgrade | hybrid | #4 | hybrid-pitchadapter | opens at upper coat
|
|
|
16
|
Wed Oct 7 14:24:06 2009 |
Dieter Uhl | BELLE Upgrade | hybrid | #5 | hybrid-pitchadapter | shorts at upper coat
|
|
|
4
|
Wed Apr 23 13:37:18 2008 |
Markus Friedl | SPS Testbeam June08 | source | hybrid 01 | analysis results of source test | Ignore the "KEK November 2007" title - that's
a legacy and is already changed :-)
|
|
|
14
|
Tue May 20 14:27:50 2008 |
Markus Friedl | BELLE Upgrade | source | micron | analysis results of source test |
*** NOTE: AFTER THIS MEASUREMENT WE REALIZED
THAT BIASING WAS NOT DONE PROPERLY
|
9x |
50
|
Fri May 29 11:47:56 2015 |
Hao Yin | Belle II | system | PS Filter | Testing PS LV filter and quantifying the required min noise lvl | Data of this entry is recorded in the folder:
LV315kHz_Injections
Injecting noise to LV with a freq. |
|
|
35
|
Thu Jun 5 10:34:29 2014 |
Benedikt Würkner | Belle II | source | Silc Module | Silc Angle Measurement 7° | Measured the Silc 03/10 Module using the
Sr90 Source to have a comparison for the
Eta-Distribution at different angles. |
|
|
34
|
Thu Jun 5 10:34:06 2014 |
Benedikt Würkner | Belle II | source | Silc Module | Silc Angle Measurement 4° | Measured the Silc 03/10 Module using the
Sr90 Source to have a comparison for the
Eta-Distribution at different angles. |
|
|
33
|
Thu Jun 5 10:33:46 2014 |
Benedikt Würkner | Belle II | source | Silc Module | Silc Angle Measurement 1° | Measured the Silc 03/10 Module using the
Sr90 Source to have a comparison for the
Eta-Distribution at different angles. |
|
|
36
|
Thu Jun 5 10:34:45 2014 |
Benedikt Würkner | Belle II | source | Silc Module | Silc Angle Measurement 10° | Measured the Silc 03/10 Module using the
Sr90 Source to have a comparison for the
Eta-Distribution at different angles. |
|