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| HEPHY logbook of the Electronics Group, Page 1 of 4 |
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| New entries since: | Thu Jan 1 01:00:00 1970 | |
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 Wed Apr 23 13:05:05 2008, Christian Irmler, SPS Testbeam June08, source, hybrid 01, time correlation between TDC and sensor measurement -> 3.1 ns RMS 
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Sun Jul 4 05:48:36 2010, Christian Irmler, BELLE Upgrade, source, Origami 6 - module 1, run002: first analysis results 7x
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Wed May 7 15:24:49 2008, Christian Irmler, SPS Testbeam June08, module, module 10/02, properties (noise, intcal), APVs bonded to the sensor 12x
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Wed May 7 15:26:24 2008, Christian Irmler, SPS Testbeam June08, module, module 20/09, properties (noise, intcal), APVs bonded to the sensor 12x
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Wed May 7 15:40:07 2008, Christian Irmler, SPS Testbeam June08, module, module 07/07, properties (noise, intcal), APVs bonded to the sensor 12x
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Wed May 7 16:12:58 2008, Christian Irmler, SPS Testbeam June08, module, module 12/08, properties (noise, intcal), APVs bonded to the sensor 12x
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Wed May 7 19:05:08 2008, Christian Irmler, SPS Testbeam June08, module, module 04/04, properties (noise, intcal), APVs bonded to the sensor 12x
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Fri May 9 09:56:15 2008, Christian Irmler, SPS Testbeam June08, module, module 06/03, properties (noise, intcal), APVs bonded to the sensor 12x
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Fri May 9 10:00:34 2008, Christian Irmler, SPS Testbeam June08, module, module 03/10, properties (noise, intcal), APVs bonded to the sensor 12x
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Fri May 9 10:04:26 2008, Christian Irmler, SPS Testbeam June08, module, module 05/05, properties (noise, intcal), APVs bonded to the sensor 12x
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Wed Apr 30 16:52:17 2008, Markus Friedl, BELLE Upgrade, module, micron, micron sensor glued to frame
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Wed Oct 7 14:23:35 2009, Dieter Uhl, BELLE Upgrade, hybrid, #4, hybrid-pitchadapter
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Wed Oct 7 14:24:06 2009, Dieter Uhl, BELLE Upgrade, hybrid, #5, hybrid-pitchadapter
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Wed Apr 23 13:37:18 2008, Markus Friedl, SPS Testbeam June08, source, hybrid 01, analysis results of source test
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Tue May 20 14:27:50 2008, Markus Friedl, BELLE Upgrade, source, micron, analysis results of source test 9x
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Fri May 29 11:47:56 2015, Hao Yin, Belle II, system, PS Filter, Testing PS LV filter and quantifying the required min noise lvl
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Thu Jun 5 10:34:29 2014, Benedikt Würkner, Belle II, source, Silc Module, Silc Angle Measurement 7°
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Thu Jun 5 10:34:06 2014, Benedikt Würkner, Belle II, source, Silc Module, Silc Angle Measurement 4°
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Thu Jun 5 10:33:46 2014, Benedikt Würkner, Belle II, source, Silc Module, Silc Angle Measurement 1°
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Thu Jun 5 10:34:45 2014, Benedikt Würkner, Belle II, source, Silc Module, Silc Angle Measurement 10°
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