|   | 
ID | 
Date | 
Author | 
Project | 
Measurement Type | 
Object ID | 
Subject  | 
Text | 
  | 
| 
 | 
  3  
 | 
Wed Apr 23 13:05:05 2008 | 
Christian Irmler | SPS Testbeam June08 | source | hybrid 01 | time correlation between TDC and sensor measurement -> 3.1 ns RMS |   | 
    | 
| 
 | 
  17  
 | 
Sun Jul  4 05:48:36 2010 | 
Christian Irmler | BELLE Upgrade | source | Origami 6 - module 1 | run002: first analysis results | Run name: run002
 
 
Run type: 0 (Hardware (Normal Run)) | 
 7x   | 
| 
 | 
  6  
 | 
Wed May  7 15:24:49 2008 | 
Christian Irmler | SPS Testbeam June08 | module | module 10/02 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to 
the sensor, respectively.
 
HV = 100 V
 
Ibias 
(100V) = 19.1 nA
 
Ibias (200V) = 23.7 nA | 
 12x   | 
| 
 | 
  9  
 | 
Wed May  7 15:26:24 2008 | 
Christian Irmler | SPS Testbeam June08 | module | module 20/09 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to 
the sensor, respectively. 
 
HV = 100 V
 
Ibias 
(100 V) = 25.1 nA
 
Ibias (200 V) = 31.4 nA | 
 12x   | 
| 
 | 
  8  
 | 
Wed May  7 15:40:07 2008 | 
Christian Irmler | SPS Testbeam June08 | module | module 07/07 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to 
the sensor, respectively. 
 
HV = 100 V
 
Ibias 
(100 V) = 20.2 nA
 
Ibias (200 V) = 21.9 nA | 
 12x   | 
| 
 | 
  7  
 | 
Wed May  7 16:12:58 2008 | 
Christian Irmler | SPS Testbeam June08 | module | module 12/08 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to 
the sensor, respectively. 
 
HV = 100 V
 
Ibias 
(100 V) = 22.2 nA
 
Ibias (200 V) = 26.5 nA | 
 12x   | 
| 
 | 
  10  
 | 
Wed May  7 19:05:08 2008 | 
Christian Irmler | SPS Testbeam June08 | module | module 04/04 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to 
the sensor, respectively. 
 
HV = 100 V
 
Ibias 
(100 V) = 27.8 nA
 
Ibias (200 V) = 32.7 nA | 
 12x   | 
| 
 | 
  11  
 | 
Fri May  9 09:56:15 2008 | 
Christian Irmler | SPS Testbeam June08 | module | module 06/03 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to 
the sensor, respectively. 
 
HV = 100 V
 
Ibias 
(100 V) = 26.5 nA
 
Ibias (200 V) = 37.8 nA | 
 12x   | 
| 
 | 
  12  
 | 
Fri May  9 10:00:34 2008 | 
Christian Irmler | SPS Testbeam June08 | module | module 03/10 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to 
the sensor, respectively. 
 
HV = 100 V
 
Ibias 
(100 V) = 18.9 nA
 
Ibias (200 V) = 25.5 nA | 
 12x   | 
| 
 | 
  13  
 | 
Fri May  9 10:04:26 2008 | 
Christian Irmler | SPS Testbeam June08 | module | module 05/05 | properties (noise, intcal), APVs bonded to the sensor | Module tested with 1 and 2 rows bonded to 
the sensor, respectively. 
 
HV = 100 V
 
Ibias 
(100 V) = 18.0 nA
 
Ibias (200 V) = 23.6 nA | 
 12x   | 
| 
 | 
  5  
 | 
Wed Apr 30 16:52:17 2008 | 
Markus Friedl | BELLE Upgrade | module | micron | micron sensor glued to frame | soeben haben wir den micron-DSSD (double metal 
layer) in den 2-teiligen rahmen geklebt und 
auf beiden seiten
 | 
   | 
| 
 | 
  15  
 | 
Wed Oct  7 14:23:35 2009 | 
Dieter Uhl | BELLE Upgrade | hybrid | #4 | hybrid-pitchadapter | opens at upper coat
 
 | 
       | 
| 
 | 
  16  
 | 
Wed Oct  7 14:24:06 2009 | 
Dieter Uhl | BELLE Upgrade | hybrid | #5 | hybrid-pitchadapter | shorts at upper coat
 
 | 
       | 
| 
 | 
  4  
 | 
Wed Apr 23 13:37:18 2008 | 
Markus Friedl | SPS Testbeam June08 | source | hybrid 01 | analysis results of source test | Ignore the "KEK November 2007" title - that's 
a legacy and is already changed :-)
 
 | 
       | 
| 
 | 
  14  
 | 
Tue May 20 14:27:50 2008 | 
Markus Friedl | BELLE Upgrade | source | micron | analysis results of source test | 
 
*** NOTE: AFTER THIS MEASUREMENT WE REALIZED 
THAT BIASING WAS NOT DONE PROPERLY
 | 
 9x   | 
| 
 | 
  
  50  
 | 
Fri May 29 11:47:56 2015 | 
Hao Yin | Belle II | system | PS Filter | Testing PS LV filter and quantifying the required min noise lvl | Data of this entry is recorded in the folder: 
LV315kHz_Injections
 
Injecting noise to LV with a freq. | 
   | 
| 
 | 
  35  
 | 
Thu Jun  5 10:34:29 2014 | 
Benedikt Würkner | Belle II | source | Silc Module | Silc Angle Measurement 7° | Measured the Silc 03/10 Module using the 
Sr90 Source to have a comparison for the 
Eta-Distribution at different angles.  | 
   | 
| 
 | 
  34  
 | 
Thu Jun  5 10:34:06 2014 | 
Benedikt Würkner | Belle II | source | Silc Module | Silc Angle Measurement 4° | Measured the Silc 03/10 Module using the 
Sr90 Source to have a comparison for the 
Eta-Distribution at different angles.  | 
   | 
| 
 | 
  33  
 | 
Thu Jun  5 10:33:46 2014 | 
Benedikt Würkner | Belle II | source | Silc Module | Silc Angle Measurement 1° | Measured the Silc 03/10 Module using the 
Sr90 Source to have a comparison for the 
Eta-Distribution at different angles.  | 
   | 
| 
 | 
  36  
 | 
Thu Jun  5 10:34:45 2014 | 
Benedikt Würkner | Belle II | source | Silc Module | Silc Angle Measurement 10° | Measured the Silc 03/10 Module using the 
Sr90 Source to have a comparison for the 
Eta-Distribution at different angles.  | 
   |