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  HEPHY logbook of the Electronics Group, Page 4 of 4  Not logged in ELOG logo
  ID Date Author Projectup Measurement Type Object ID Subject
  10   Wed May 7 19:05:08 2008 Christian IrmlerSPS Testbeam June08modulemodule 04/04properties (noise, intcal), APVs bonded to the sensor
Module tested with 1 and 2 rows bonded to the sensor, respectively. HV = 100 V Ibias (100 V) = 27.8 nA Ibias (200 V) = 32.7 nA
  11   Fri May 9 09:56:15 2008 Christian IrmlerSPS Testbeam June08modulemodule 06/03properties (noise, intcal), APVs bonded to the sensor
Module tested with 1 and 2 rows bonded to the sensor, respectively. HV = 100 V Ibias (100 V) = 26.5 nA Ibias (200 V) = 37.8 nA
  12   Fri May 9 10:00:34 2008 Christian IrmlerSPS Testbeam June08modulemodule 03/10properties (noise, intcal), APVs bonded to the sensor
Module tested with 1 and 2 rows bonded to the sensor, respectively. HV = 100 V Ibias (100 V) = 18.9 nA Ibias (200 V) = 25.5 nA
  13   Fri May 9 10:04:26 2008 Christian IrmlerSPS Testbeam June08modulemodule 05/05properties (noise, intcal), APVs bonded to the sensor
Module tested with 1 and 2 rows bonded to the sensor, respectively. HV = 100 V Ibias (100 V) = 18.0 nA Ibias (200 V) = 23.6 nA
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