Home CMS Production Clean room MedAustron HEPHY testbeams old
electronics module assembly SiDDaTA
  HEPHY logbook of the Electronics Group, Page 4 of 4  Not logged in ELOG logo
Entry  Wed Apr 23 13:37:18 2008, Markus Friedl, SPS Testbeam June08, source, hybrid 01, analysis results of source test vie_run001_cluster_sig_0.gifvie_run001_cluster_noi_0.gifvie_run001_cluster_hit_0.gifvie_run001_cluster_clw_0.gif
Ignore the "KEK November 2007" title - that's a legacy and is already changed :-)

As of now, there is no distinction in 16 separate zones. However, the gaps between the the zones are clearly visible in the Hit Profile, as the edge strips
Entry  Wed Apr 23 13:05:05 2008, Christian Irmler, SPS Testbeam June08, source, hybrid 01, time correlation between TDC and sensor measurement -> 3.1 ns RMS vie_run001_tpeak_vs_TDC.gif
 
Entry  Tue Apr 22 19:34:09 2008, Markus Friedl, SPS Testbeam June08, module, hybrid 01, Properties of hybrid 01, sensor fully bonded, HV=100V 6x
HV bias glued to backplane, HV=100V
Entry  Fri Apr 18 17:23:26 2008, Markus Friedl, SPS Testbeam June08, hybrid, hybrid 01, Noise of hybrid 01, sensor fully bonded, no HV hybrid01_sen_nohv_pednoise_apv0.pnghybrid01_sen_nohv_pednoise_apv1.png
HV bias not yet glued to backplane
ELOG V3.1.4-966e3dd