 Tue May 19 09:31:50 2015, Hao Yin, , , , Noise Test ITA
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Everything works except L3 p-side.
The config file is shown in the following:
### Original Configuration File Name: /home/katsuro/tuxdaq_devel/config/delay_scan.latency_scan.cfg ### |
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Tue May 19 10:08:53 2015, Hao Yin, , , , FADC system setup success
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3 FADC. All Channel/APV25 running (except L3 n first and last -> not connected (bonding))
n-side: all connectors
p-side: 0x01: 1, 2, 4 and 0x02, 1 with L3 p and L4 p (Telescope) |
Tue May 19 13:42:04 2015, Hao Yin, , , , L6 Noise inJection Setup 
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Test Nr. 1:
RLC between DockBox and Hybrid (both side).
Preliminary Test on L6, but all other sensors are connected. |
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Wed May 20 10:12:12 2015, Hao Yin, , , , Ladder RLC test (CMC Injection)
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L5 Ladder Test
folder: /mnt/data/ITA_NOISE_TESTS/Ladder_test
Setup: ladder only, noise injection on one hybrid (injection point = cable between hybrid and junction board, see attachment |
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Thu May 21 18:23:22 2015, Hao Yin, , , , Noise Injection LV cable
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(TestNr. 15)
injecting sin wave into LV at different frequencies to analyse the output frequency and noise ground level after the junction borad. |
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Fri May 22 12:01:32 2015, Hao Yin, , , , CMC injection LV 10V
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Comparison w/o filter (LC) connected to -z_n side.
Mateo has the results. |
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Mon Nov 30 15:12:19 2015, Hao Yin, , , , FIR_ADC config
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FIR filter and ADC delay test:
ADC delay and FIR filter with and without cooling to reproduce error detected during CERN beam test 2015.
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Fri Apr 18 17:23:26 2008, Markus Friedl, SPS Testbeam June08, hybrid, hybrid 01, Noise of hybrid 01, sensor fully bonded, no HV
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| HV bias not yet glued to backplane |
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Wed Oct 7 14:23:35 2009, Dieter Uhl, BELLE Upgrade, hybrid, #4, hybrid-pitchadapter
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opens at upper coat
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Wed Oct 7 14:24:06 2009, Dieter Uhl, BELLE Upgrade, hybrid, #5, hybrid-pitchadapter
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shorts at upper coat
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Tue Apr 22 19:34:09 2008, Markus Friedl, SPS Testbeam June08, module, hybrid 01, Properties of hybrid 01, sensor fully bonded, HV=100V 6x
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| HV bias glued to backplane, HV=100V |
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Wed Apr 30 16:52:17 2008, Markus Friedl, BELLE Upgrade, module, micron, micron sensor glued to frame
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soeben haben wir den micron-DSSD (double metal layer) in den 2-teiligen rahmen geklebt und auf beiden seiten
temporäre kapton-stückerln aufgeklebt, über die bias appliziert werden kann. nach trocknung und bonden der
bias-verbindungen (montag, 5.5.2008) wird dieser für sensor-tests zur verfügung stehen. |
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Wed May 7 15:24:49 2008, Christian Irmler, SPS Testbeam June08, module, module 10/02, properties (noise, intcal), APVs bonded to the sensor 12x
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Module tested with 1 and 2 rows bonded to the sensor, respectively.
HV = 100 V
Ibias (100V) = 19.1 nA
Ibias (200V) = 23.7 nA |
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Wed May 7 15:26:24 2008, Christian Irmler, SPS Testbeam June08, module, module 20/09, properties (noise, intcal), APVs bonded to the sensor 12x
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Module tested with 1 and 2 rows bonded to the sensor, respectively.
HV = 100 V
Ibias (100 V) = 25.1 nA
Ibias (200 V) = 31.4 nA |
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Wed May 7 15:40:07 2008, Christian Irmler, SPS Testbeam June08, module, module 07/07, properties (noise, intcal), APVs bonded to the sensor 12x
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Module tested with 1 and 2 rows bonded to the sensor, respectively.
HV = 100 V
Ibias (100 V) = 20.2 nA
Ibias (200 V) = 21.9 nA |
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Wed May 7 16:12:58 2008, Christian Irmler, SPS Testbeam June08, module, module 12/08, properties (noise, intcal), APVs bonded to the sensor 12x
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Module tested with 1 and 2 rows bonded to the sensor, respectively.
HV = 100 V
Ibias (100 V) = 22.2 nA
Ibias (200 V) = 26.5 nA |
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Wed May 7 19:05:08 2008, Christian Irmler, SPS Testbeam June08, module, module 04/04, properties (noise, intcal), APVs bonded to the sensor 12x
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Module tested with 1 and 2 rows bonded to the sensor, respectively.
HV = 100 V
Ibias (100 V) = 27.8 nA
Ibias (200 V) = 32.7 nA |
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Fri May 9 09:56:15 2008, Christian Irmler, SPS Testbeam June08, module, module 06/03, properties (noise, intcal), APVs bonded to the sensor 12x
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Module tested with 1 and 2 rows bonded to the sensor, respectively.
HV = 100 V
Ibias (100 V) = 26.5 nA
Ibias (200 V) = 37.8 nA |
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Fri May 9 10:00:34 2008, Christian Irmler, SPS Testbeam June08, module, module 03/10, properties (noise, intcal), APVs bonded to the sensor 12x
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Module tested with 1 and 2 rows bonded to the sensor, respectively.
HV = 100 V
Ibias (100 V) = 18.9 nA
Ibias (200 V) = 25.5 nA |
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Fri May 9 10:04:26 2008, Christian Irmler, SPS Testbeam June08, module, module 05/05, properties (noise, intcal), APVs bonded to the sensor 12x
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Module tested with 1 and 2 rows bonded to the sensor, respectively.
HV = 100 V
Ibias (100 V) = 18.0 nA
Ibias (200 V) = 23.6 nA |
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