Home CMS Production Clean room MedAustron HEPHY testbeams old
electronics module assembly SiDDaTA scratch
  HEPHY logbook of the Electronics Group, Page 1 of 4  Not logged in ELOG logo
Entry  Fri Apr 18 17:23:26 2008, Markus Friedl, SPS Testbeam June08, hybrid, hybrid 01, Noise of hybrid 01, sensor fully bonded, no HV hybrid01_sen_nohv_pednoise_apv0.pnghybrid01_sen_nohv_pednoise_apv1.png
HV bias not yet glued to backplane
Entry  Tue Apr 22 19:34:09 2008, Markus Friedl, SPS Testbeam June08, module, hybrid 01, Properties of hybrid 01, sensor fully bonded, HV=100V 6x
HV bias glued to backplane, HV=100V
Entry  Wed Apr 23 13:05:05 2008, Christian Irmler, SPS Testbeam June08, source, hybrid 01, time correlation between TDC and sensor measurement -> 3.1 ns RMS vie_run001_tpeak_vs_TDC.gif
 
Entry  Wed Apr 23 13:37:18 2008, Markus Friedl, SPS Testbeam June08, source, hybrid 01, analysis results of source test vie_run001_cluster_sig_0.gifvie_run001_cluster_noi_0.gifvie_run001_cluster_hit_0.gifvie_run001_cluster_clw_0.gif
Ignore the "KEK November 2007" title - that's a legacy and is already changed :-)

As of now, there is no distinction in 16 separate zones. However, the gaps between the the zones are clearly visible in the Hit Profile, as the edge strips
Entry  Wed Apr 30 16:52:17 2008, Markus Friedl, BELLE Upgrade, module, micron, micron sensor glued to frame 
soeben haben wir den micron-DSSD (double metal layer) in den 2-teiligen rahmen geklebt und auf beiden seiten
temporäre kapton-stückerln aufgeklebt, über die bias appliziert werden kann. nach trocknung und bonden der
bias-verbindungen (montag, 5.5.2008) wird dieser für sensor-tests zur verfügung stehen.
Entry  Wed May 7 15:24:49 2008, Christian Irmler, SPS Testbeam June08, module, module 10/02, properties (noise, intcal), APVs bonded to the sensor 12x
Module tested with 1 and 2 rows bonded to the sensor, respectively.
HV = 100 V
Ibias (100V) = 19.1 nA
Ibias (200V) = 23.7 nA
Entry  Wed May 7 15:26:24 2008, Christian Irmler, SPS Testbeam June08, module, module 20/09, properties (noise, intcal), APVs bonded to the sensor 12x
Module tested with 1 and 2 rows bonded to the sensor, respectively. 
HV = 100 V
Ibias (100 V) = 25.1 nA
Ibias (200 V) = 31.4 nA
Entry  Wed May 7 15:40:07 2008, Christian Irmler, SPS Testbeam June08, module, module 07/07, properties (noise, intcal), APVs bonded to the sensor 12x
Module tested with 1 and 2 rows bonded to the sensor, respectively. 
HV = 100 V
Ibias (100 V) = 20.2 nA
Ibias (200 V) = 21.9 nA
Entry  Wed May 7 16:12:58 2008, Christian Irmler, SPS Testbeam June08, module, module 12/08, properties (noise, intcal), APVs bonded to the sensor 12x
Module tested with 1 and 2 rows bonded to the sensor, respectively. 
HV = 100 V
Ibias (100 V) = 22.2 nA
Ibias (200 V) = 26.5 nA
Entry  Wed May 7 19:05:08 2008, Christian Irmler, SPS Testbeam June08, module, module 04/04, properties (noise, intcal), APVs bonded to the sensor 12x
Module tested with 1 and 2 rows bonded to the sensor, respectively. 
HV = 100 V
Ibias (100 V) = 27.8 nA
Ibias (200 V) = 32.7 nA
Entry  Fri May 9 09:56:15 2008, Christian Irmler, SPS Testbeam June08, module, module 06/03, properties (noise, intcal), APVs bonded to the sensor 12x
Module tested with 1 and 2 rows bonded to the sensor, respectively. 
HV = 100 V
Ibias (100 V) = 26.5 nA
Ibias (200 V) = 37.8 nA
Entry  Fri May 9 10:00:34 2008, Christian Irmler, SPS Testbeam June08, module, module 03/10, properties (noise, intcal), APVs bonded to the sensor 12x
Module tested with 1 and 2 rows bonded to the sensor, respectively. 
HV = 100 V
Ibias (100 V) = 18.9 nA
Ibias (200 V) = 25.5 nA
Entry  Fri May 9 10:04:26 2008, Christian Irmler, SPS Testbeam June08, module, module 05/05, properties (noise, intcal), APVs bonded to the sensor 12x
Module tested with 1 and 2 rows bonded to the sensor, respectively. 
HV = 100 V
Ibias (100 V) = 18.0 nA
Ibias (200 V) = 23.6 nA
Entry  Tue May 20 14:27:50 2008, Markus Friedl, BELLE Upgrade, source, micron, analysis results of source test 9x

*** NOTE: AFTER THIS MEASUREMENT WE REALIZED THAT BIASING WAS NOT DONE PROPERLY
          HENCE THE RESULTS BELOW ARE NOT RELIABLE 
Entry  Wed Oct 7 14:23:35 2009, Dieter Uhl, BELLE Upgrade, hybrid, #4, hybrid-pitchadapter pitchadapter4_lower_coat.gifpitchadapter4_lower_coat_opens.gifpitchadapter4_upper_coat.gifpitchadapter4_upper_coat_opens.gif
opens at upper coat
Entry  Wed Oct 7 14:24:06 2009, Dieter Uhl, BELLE Upgrade, hybrid, #5, hybrid-pitchadapter pitchadapter5_lower_coat_opens.gifpitchadapter5_lower_coat.gifpitchadapter5_upper_coat_opens.gifpitchadapter5_upper_coat.gif
shorts at upper coat
Entry  Sun Jul 4 05:48:36 2010, Christian Irmler, BELLE Upgrade, source, Origami 6 - module 1, run002: first analysis results 7x
Run name: run002

Run type: 0 (Hardware (Normal Run))
Entry  Wed May 7 14:36:29 2014, Benedikt Würkner, Belle II, source, L3 module, No 1 of 6 room temperature measurements using Sr90 Source (multi6) 10x
Sr90 Radioactive Source
No cooling
Module position: -5:-20(top left)
Entry  Wed May 7 15:04:32 2014, Benedikt Würkner, Belle II, source, L3 module, No 2 of 6 room temperature measurements using Sr90 Source (multi6) 10x
Sr90 Radioactive Source
No cooling
Module position: -32:-20(top center)
Entry  Wed May 7 15:53:38 2014, Benedikt Würkner, Belle II, source, L3 module, No 3 of 6 room temperature measurements using Sr90 Source (multi6) 10x
Sr90 Radioactive Source
No cooling
Module position: -59:-20(top right)
ELOG V3.1.5-fc6679b